Global Semiconductor Metrology Market

Global semiconductor metrology market by measurement type (critical dimension (CD) measurement, film thickness measurement, overlay measurement), by region (Asia Pacific, Europe, North America, Rest of the World (RoW)), industry snapshot, 2022-2028

SKU: GS02100I Category: Region:



Metrology is the science of measuring and characterizing tiny structures and materials, and there are a number of tools and technologies within this category. It is important for the management of the semiconductor manufacturing process. There are 400-600 steps in the overall manufacturing process of semiconductor wafers, which are undertaken in the course of one to two months. If any defects occur early on in the process, all the work undertaken in the subsequent time-consuming steps will be wasted. Metrology processes are therefore established at critical points of semiconductor manufacturing process to ensure that a certain yield can be confirmed and maintained. The global semiconductor metrology market was estimated at USD 1,474 million in 2021 and is expected to hit USD 2,144 million by 2028, registering a CAGR of 5.5% from 2022 to 2028 as per the latest report by Gen Consulting Company.

This industry report offers market estimates of the global market, followed by a detailed analysis of the measurement type, and region. The global market data on semiconductor metrology can be segmented by measurement type: critical dimension (CD) measurement, film thickness measurement, overlay measurement. The CD measurement segment held the largest share of the global semiconductor metrology market in 2021 and is anticipated to hold its share during the forecast period. Semiconductor metrology market is further segmented by region: Asia Pacific, Europe, North America, Rest of the World (RoW).

The global semiconductor metrology market is highly competitive. Some of the leading companies operating in the market are Applied Materials Inc., ASML Holding N.V., AUROS Technology Inc., Hitachi High-Technologies Corporation, JASCO International Co. Ltd., KLA Corporation, Malvern Panalytical Ltd., Nova Ltd., Onto Innovation Inc., Zygo Corporation.

The data-centric report focuses on market trends, status and outlook for segments. With comprehensive market assessment across the major geographies, the report is a valuable asset for the existing players, new entrants and the future investors.

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Global Semiconductor Metrology Market

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