Global Electric Double-layer Capacitor (EDLC) Market 2023
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Metrology is the science of measuring and characterizing tiny structures and materials, and there are a number of tools and technologies within this category. It is important for the management of the semiconductor manufacturing process. There are 400-600 steps in the overall manufacturing process of semiconductor wafers, which are undertaken in the course of one to two months. If any defects occur early on in the process, all the work undertaken in the subsequent time-consuming steps will be wasted. Metrology processes are therefore established at critical points of semiconductor manufacturing process to ensure that a certain yield can be confirmed and maintained. The global semiconductor metrology market was estimated at USD 1,474 million in 2021 and is expected to hit USD 2,144 million by 2028, registering a CAGR of 5.5% from 2022 to 2028 as per the latest report by Gen Consulting Company.
This industry report offers market estimates of the global market, followed by a detailed analysis of the measurement type, and region. The global market data on semiconductor metrology can be segmented by measurement type: critical dimension (CD) measurement, film thickness measurement, overlay measurement. The CD measurement segment held the largest share of the global semiconductor metrology market in 2021 and is anticipated to hold its share during the forecast period. Semiconductor metrology market is further segmented by region: Asia Pacific, Europe, North America, Rest of the World (RoW).
The global semiconductor metrology market is highly competitive. Some of the leading companies operating in the market are Applied Materials Inc., ASML Holding N.V., AUROS Technology Inc., Hitachi High-Technologies Corporation, JASCO International Co. Ltd., KLA Corporation, Malvern Panalytical Ltd., Nova Ltd., Onto Innovation Inc., Zygo Corporation.
The data-centric report focuses on market trends, status and outlook for segments. With comprehensive market assessment across the major geographies, the report is a valuable asset for the existing players, new entrants and the future investors.
Why buy this report?
– Get a detailed picture of the Global Semiconductor Metrology Market
– Identify segments/areas to invest in over the forecast period in the Global Semiconductor Metrology Market
– Understand the competitive environment, the market’s leading players
– The market estimate for ease of analysis across scenarios in Excel format.
– Strategy consulting and research support for three months.
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Part 1. Summary
Part 2. Introduction
· Study period
· Geographical scope
· Market segmentation
Part 3. Semiconductor metrology market overview
Part 4. Market breakdown by measurement type
· Critical dimension (CD) measurement
· Film thickness measurement
· Overlay measurement
Part 5. Market breakdown by region
· Asia Pacific
· Europe
· North America
· Rest of the World (RoW)
Part 6. Key companies
· Applied Materials, Inc.
· ASML Holding N.V.
· AUROS Technology, Inc.
· Hitachi High-Technologies Corporation
· JASCO International Co., Ltd.
· KLA Corporation
· Malvern Panalytical Ltd.
· Nova Ltd.
· Onto Innovation Inc.
· Zygo Corporation
Part 7. Methodology
Applied Materials, Inc.
ASML Holding N.V.
AUROS Technology, Inc.
Hitachi High-Technologies Corporation
JASCO International Co., Ltd.
KLA Corporation
Malvern Panalytical Ltd.
Nova Ltd.
Onto Innovation Inc.
Zygo Corporation
REPORT ATTRIBUTE | DETAILS |
---|---|
Base Year | 2021 |
Forecast Year | 2022-2028 |
CAGR (2022-2028) | 5.5% |
Pages | 20 |
Key Players | Applied Materials Inc., ASML Holding N.V., AUROS Technology Inc., Hitachi High-Technologies Corporation, JASCO International Co. Ltd., KLA Corporation, Malvern Panalytical Ltd., Nova Ltd., Onto Innovation Inc., Zygo Corporation |
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